Features: 1. The sample automatic lifting platform, work is very convenient. 2. The sample plate of automatic rotation, the measurement area is bigger, and can maximize eliminate particles and uneven errors; 3. Vacuum measurement, can be greater extent to improve the detection limit, is conducive to more metal and other light measurement; 4. Advanced modular design concept, to ensure the instrument subsequent high scalability; 5. Using low power window X-ray tube diameter is bigger, better efficiency of samples; 6. Silicon drift SDD electric refrigeration semiconductor detector, resolution and counting rate is higher, is advantageous to the more complex sample analysis. Technical indicators (1) measuring range: 1-40 kev. (2) analysis element range: Na - U; (3) the range of content analysis: 1 PPM - 99.99%; (4) resolution: better than that of the 130 ev; (5) the minimum detection limit: Pb 5 PPM or less; (6) working environment temperature: 0 to 40 ℃; (7) working environment relative humidity: 80% or less (condensation) (8)Measuring time : 10-2550 s (adjustable) (9) input power supply: AC 220 v + 10%, 50 hz. (10) rated power: 300 w; (11) detector types: adopt the latest high-performance electric refrigeration silicon drift SDD probe; (12), 5 million pixels of a CCD camera, which can effectively test area in the implementation of the observation, and photos taken material, can be used as part of the test report. (13) instrument size: 600 (W) x 570 x 570 mm (H) (D) The sample chamber: the sample chamber size (14) : 300 * 300 * 100 mm (15) weight: 100 kg
Features: 1. The sample automatic lifting platform, work is very convenient. 2. The sample plate of automatic rotation, the measurement area is bigger, and can maximize eliminate particles and uneven errors; 3. Vacuum measurement, can be greater extent to improve the detection limit, is conducive to more metal and other light measurement; 4. Advanced modular design concept, to ensure the instrument subsequent high scalability; 5. Using low power window X-ray tube diameter is bigger, better efficiency of samples; 6. Silicon drift SDD electric refrigeration semiconductor detector, resolution and counting rate is higher, is advantageous to the more complex sample analysis.
