Position: Home > > Physical property test > Nondestructive testing instrument > X ray realtime imaging detection system > AL-WJ-0902A microfocus X- ray detector for Semiconductor inspection

AL-WJ-0902A microfocus X- ray detector for Semiconductor inspection

Product ID:WWsscx001

Price: Please inquire PDF Format
Supply Ability:20SETS/MON
Port:SHENZHEN
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  • Product Introduction
  • Consulting
  • Model NumberAL-WJ-0902A
    Brand NameYM
    Payment TermsT/T, paypal
    Product introduction
    The system is a concentration of modern computer software technology, precision machinery manufacturing technology, optical technology, electronic technology, sensor technology, non-destructive testing technology and image processing technology is one of the high-tech products. For product research, failure analysis, it is highly reliable screening and quality evaluation, process improvement, etc. The product technology has obtained national invention patent.
    Scope of application
    suitable for BGA detection, CSP, Flip, chip
    Detection of PCB plate welding
    a variety of battery testing
    IC package detection
    capacitors, resistors and other components
    internal defects of the metal materials, media materials
    internal structure of the lightweight materials and components
    electric heating tube, pearl, precision devices.
    Technical indicators
    micro focus: X - ray source
    tube voltage adjustment range: 20 ~ 225 KV
    tube current modulation range: 0 ~ 3mA
    focal spot size: 1 m, 5 m, 30 m
    system resolution: 70 LP/cm
    magnification: 5000 times
    detection platform: the X Y Z multi axis motion
     
     

  • Product introduction
    The system is a concentration of modern computer software technology, precision machinery manufacturing technology, optical technology, electronic technology, sensor technology, non-destructive testing technology and image processing technology is one of the high-tech products.

     
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