10XB-PC Research Metallurgical Microscope

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10XB-PC Research Metallurgical Microscope

Product ID：GGXjx004

Price: Please inquire PDF Format

Supply Ability:50SETS/MON

Port:SHENZHEN

Product Introduction
Other information

Model Number10XB-PC

Brand NameSHGUANGXUE

Payment TermsTT，PAYPAL，Alibaba.com Pay

10XB-PC Research Metallurgical Microscope

Product Introduction
The 10XB-PC Research Metallurgical Microscope is designed for advanced materials inspection and microstructure analysis in the electronics, semiconductor, silicon wafer manufacturing, and metallurgical industries. Featuring an infinity-corrected optical system, multiple illumination modes, and USB 2.0 digital imaging, this research-grade metallurgical microscope supports detailed specimen observation, image capture, video recording, and image processing.
Its ergonomic design, coaxial focusing mechanism, and adjustable illumination provide convenient and reliable operation for laboratory research, quality control, and industrial inspection.

Performance Features
• Infinity-Corrected Optical System: Supports high-quality microscopic observation and flexible optical configuration.
• Multiple Observation Modes: Supports transmitted light, reflected light, polarized light, and darkfield observation.
• Trinocular Viewing Head: Equipped with a standard C-mount camera interface for digital imaging.
• Precision Focusing: Coaxial coarse and fine focusing with a fine-focus increment of 0.002 mm.
• Adjustable Illumination: Transmitted and incident illumination with adjustable brightness.
• Digital Image Acquisition: USB 2.0 camera interface with transfer speeds up to 480 Mb/s and a maximum resolution of 2592 × 1944 pixels.
• Image Processing Software: Supports image capture, video recording, image processing, scale calibration, text annotation, and saving composite images.

Working Principle
The 10XB-PC metallurgical microscope uses an optical objective and eyepiece system to magnify specimen details for visual inspection. Its infinity-corrected optical design supports clear imaging, while transmitted or reflected illumination enables observation of specimens under different optical conditions.
Darkfield and polarized-light modes provide additional contrast for suitable materials and structures. The trinocular port connects to a digital camera, which converts the optical image into electronic data for display, capture, measurement-scale annotation, and image processing on a computer.

Technical Parameters

Parameter	Specification
Model	10XB-PC
Microscope Type	Research-grade metallurgical microscope
Optical System	Infinity-corrected optical system
Viewing Head	Trinocular, standard C-mount
Observation Modes	Transmitted light, reflected light, polarized light, darkfield
Standard Eyepiece Magnification	10×
Eyepiece Field of View	22 mm
Objective Magnification	5×
Objective Numerical Aperture (NA)	0.10
Objective Working Distance	29.4 mm
Nosepiece	Four-position revolving nosepiece
Stage Type	Double-layer mechanical stage
Stage Dimensions	182 × 151 mm
Stage Travel	76 × 51 mm
Focusing Mechanism	Coaxial coarse and fine adjustment
Fine-Focus Increment	0.002 mm
Illumination	Transmitted and incident illumination
Light Source Rating	12 V, 30 W
Power Supply	AC 85–230 V
Camera Interface	USB 2.0, up to 480 Mb/s
Camera Sensitivity	1 V/lux·s at 550 nm
Pixel Size	2.2 × 2.2 μm
White Balance	Automatic and manual, one-touch adjustment
Frame Rate	40 fps
Maximum Image Resolution	2592 × 1944 pixels
Image Software	Image display, capture, video recording, image processing, scale and text annotation
Image Export	Composite images with scale bars and text annotations

Note: The specifications above are based on the supplied product information. Confirm the complete objective configuration and camera compatibility with the manufacturer.

Application Scenarios
• Semiconductor Inspection: Examine silicon wafers and semiconductor materials for surface features and defects.
• Metallographic Analysis: Observe metal microstructures and support metallographic sample inspection.
• Electronics Manufacturing: Inspect electronic components and precision materials.
• Materials Science Research: Study material surfaces, structural characteristics, and optical contrast.
• Industrial Quality Control: Capture and document microscopic images for inspection reports.
• Laboratory Education and Research: Support digital microscopy, image analysis, and specimen documentation.

10XB-PC vs. Conventional Metallurgical Microscopes

Comparison Item	10XB-PC Research Metallurgical Microscope	Conventional Basic Metallurgical Microscope
Optical System	Infinity-corrected	Depends on model
Observation Modes	Transmitted, reflected, polarized, darkfield	Often model-dependent
Viewing Head	Trinocular with standard C-mount	Often binocular or trinocular
Digital Imaging	USB 2.0 camera configuration	May require optional camera accessories
Maximum Image Resolution	2592 × 1944 pixels	Depends on camera
Image Annotation	Scale bars and text overlays	Software-dependent
Focusing	Coaxial coarse and fine focusing	Depends on model
Typical Applications	Research, semiconductor inspection, metallurgy	Routine inspection and general laboratory use

Frequently Asked Questions (FAQ)
1. What is the 10XB-PC research metallurgical microscope used for?
It is designed for microscopic inspection and materials research in semiconductor manufacturing, electronics, metallurgy, and related industrial laboratories.
2. Which observation modes does the 10XB-PC support?
It supports transmitted light, reflected light, polarized light, and darkfield observation.
3. Can the 10XB-PC capture digital microscope images?
Yes. Its trinocular head supports a standard C-mount camera interface, and the supplied digital imaging configuration supports USB 2.0 connectivity.
4. What is the maximum digital image resolution?
The specified maximum image acquisition resolution is 2592 × 1944 pixels.
5. Does the microscope support video recording?
Yes. The imaging software supports image display, still-image capture, video recording, and image processing. The specified camera frame rate is 40 fps.
6. What is the fine-focusing precision?
The fine-focus increment is 0.002 mm, supporting precise focusing during specimen observation.
7. Can the software add scale bars and annotations?
Yes. Users can add calibrated scale bars and text annotations to captured images, combine them with the image, and save the composite file.
8. What types of samples can be examined?
Suitable applications include metal samples, silicon wafers, semiconductor materials, electronic components, and other specimens compatible with the microscope's optical configuration.
9. Can the microscope be used for quantitative image analysis?
It supports image processing and scale-bar annotation. Specific measurement and quantitative analysis capabilities depend on the supplied software version and calibration settings.

Frequently Asked Questions (FAQ)
1. What is the 10XB-PC research metallurgical microscope used for?
It is designed for microscopic inspection and materials research in semiconductor manufacturing, electronics, metallurgy, and related industrial laboratories.
2. Which observation modes does the 10XB-PC support?
It supports transmitted light, reflected light, polarized light, and darkfield observation.
3. Can the 10XB-PC capture digital microscope images?
Yes. Its trinocular head supports a standard C-mount camera interface, and the supplied digital imaging configuration supports USB 2.0 connectivity.
4. What is the maximum digital image resolution?
The specified maximum image acquisition resolution is 2592 × 1944 pixels.
5. Does the microscope support video recording?
Yes. The imaging software supports image display, still-image capture, video recording, and image processing. The specified camera frame rate is 40 fps.
6. What is the fine-focusing precision?
The fine-focus increment is 0.002 mm, supporting precise focusing during specimen observation.
7. Can the software add scale bars and annotations?
Yes. Users can add calibrated scale bars and text annotations to captured images, combine them with the image, and save the composite file.
8. What types of samples can be examined?
Suitable applications include metal samples, silicon wafers, semiconductor materials, electronic components, and other specimens compatible with the microscope's optical configuration.
9. Can the microscope be used for quantitative image analysis?
It supports image processing and scale-bar annotation. Specific measurement and quantitative analysis capabilities depend on the supplied software version and calibration settings.