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YUT2800 series flaw detector for Workpiece defect detection

Product ID:WWcsts037

Price: Please inquire PDF Format
Supply Ability:40 SETS/MON
Port:SHENZHEN
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  • Product Introduction
  • Consulting
  • Model NumberYUT2800
    Brand NameYUSHIXIANFENG
    Payment TermsT/T, paypal
    YUT2800 series flaw detector
     
    Features:
       Full-screen display function: Make the echo display area cover the entire screen, giving the worker the maximum window experience.
       Mass storage: Stores up to 1000 data sets, including waveforms, curves, parameters, etc. (including 1000 channels in the traditional sense).
       Measuring point: the peak or leading edge of the echo in the gate.
       Echo-Echo Thickness: Eliminates zero calibration and directly measures the net thickness of the substrate through the coating.
       Crest memory: The real-time envelope shows the highest wave of defects. Recording the maximum value of the defect helps the defect to be accurately positioned and quickly scanned, and the envelope waveform can be used to help define the defect.
       Auto Gain: Automatically adjusts the gain to the set amplitude.
       Alarm function: incoming wave / lost wave alarm.
       Solid waveform display: increase the visual contrast of the waveform, and the quick scan is not easy to miss.
       Real Time Clock: Automatically records the date and time when the waveform was stored.
       Display freeze: capture waveform and sound path data at any time, and move the gate to measure echo parameters after freezing.
       Defect location: Real-time display of sound path S, horizontal X, depth Y, wave height H.
       Quantification of defects: dB difference, SL quantitative value display in real time.
       Digital suppression: 0-80%, in 1% increments, does not affect linearity and gain.
       A, B gate: 2 independent measurement gates, monitoring echo amplitude and sound path distance.
       DAC curve: The perfect DAC curve function, the curve changes with the change of gain, sound path and displacement.
        Variable Transmit Pulse Generator: The pulse voltage is continuously adjustable from 50 to 400 volts and the pulse width is continuously adjustable from 25 to 1000 nanoseconds (2800 and 2820).
        Impedance matching: 33/50/100/500 ohm four-speed adjustable.
        Probe pulse width: 2-1000us continuously adjustable
        Receive filter: 1-4MHz, 0.5-15MHz two adjustable.
        Repeatable frequency multi-shift adjustable: Avoid reverb (phantom) signals when detecting large workpieces.
       Working language: Chinese, English Two operating interfaces.
       Data communication: Through RS232 interface and computer communication, waveform and data transmission are realized, and the detection of flaw detection results and the generation and printout of flaw detection reports on the computer are realized.
    Technical Parameters:
    Operating frequency: (0.5-15)MHz
    Material sound velocity: (1000-9999) m/s
    Working mode: pulse echo, twin crystal
    Pulse shift: (0-2000) mm
    Probe zero point: (0-99.99)us
    Gain adjustment: (0-110) dB, (0.1, 1, 2, 6) dB step
    Adjustable four-speed damping: 33/50/100/500Ω
    Receive filter: 1-4MHz, 0.5-15MHz two adjustable
    Vertical linearity error: ≤3%
    Horizontal linearity error: ≤0.3%
    Resolution: ≥32dB
    Dynamic range: ≥30dB
    Sensitivity margin: ≥55dB (depth 200mm Φ2 flat bottom hole)
    Average electrical noise level: ≤10%
    Battery working time: >8 hours
    Power supply: 12V DC, 220V AC
    Probe pulse width: 2-1000us continuously adjustable
    Repeatable frequency multi-shift adjustable: Avoid reverberation when detecting large workpieces
    Dimensions: 270mmX190mmX60mm
    Weight: 2Kg (with battery)
     
  • Features:
       Full-screen display function: Make the echo display area cover the entire screen, giving the worker the maximum window experience.
       Mass storage: Stores up to 1000 data sets, including waveforms, curves, parameters, etc. (including 1000 channels in the traditional sense).
       Measuring point: the peak or leading edge of the echo in the gate.
       Echo-Echo Thickness: Eliminates zero calibration and directly measures the net thickness of the substrate through the coating.
       Crest memory: The real-time envelope shows the highest wave of defects. Recording the maximum value of the defect helps the defect to be accurately positioned and quickly scanned, and the envelope waveform can be used to help define the defect.
       Auto Gain: Automatically adjusts the gain to the set amplitude.
       Alarm function: incoming wave / lost wave alarm.
       Solid waveform display: increase the visual contrast of the waveform, and the quick scan is not easy to miss.
       Real Time Clock: Automatically records the date and time when the waveform was stored.
       Display freeze: capture waveform and sound path data at any time, and move the gate to measure echo parameters after freezing.
       Defect location: Real-time display of sound path S, horizontal X, depth Y, wave height H.
       Quantification of defects: dB difference, SL quantitative value display in real time.
       Digital suppression: 0-80%, in 1% increments, does not affect linearity and gain.
       A, B gate: 2 independent measurement gates, monitoring echo amplitude and sound path distance.
       DAC curve: The perfect DAC curve function, the curve changes with the change of gain, sound path and displacement.
        Variable Transmit Pulse Generator: The pulse voltage is continuously adjustable from 50 to 400 volts and the pulse width is continuously adjustable from 25 to 1000 nanoseconds (2800 and 2820).
        Impedance matching: 33/50/100/500 ohm four-speed adjustable.
        Probe pulse width: 2-1000us continuously adjustable
        Receive filter: 1-4MHz, 0.5-15MHz two adjustable.
        Repeatable frequency multi-shift adjustable: Avoid reverb (phantom) signals when detecting large workpieces.
       Working language: Chinese, English Two operating interfaces.
       Data communication: Through RS232 interface and computer communication, waveform and data transmission are realized, and the detection of flaw detection results and the generation and printout of flaw detection reports on the computer are realized.
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