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TF-5500 X-ray diffraction total reflection fluorescence spectrometer

Product ID:FXys0010

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Supply Ability:20SETS/MON
Port:SHENZHEN
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  • Product Introduction
  • Consulting
  • Model NumberTF-5500
    Brand NameYIMA
    Payment TermsT/T, paypal
    Introduction:
    TF-5500 X-ray Diffraction / Total Reflection Fluorescence Spectrometer is a new generation multi-function analysis instrument newly developed by our company. It can perform both X-ray diffraction and total reflection fluorescence spectroscopy. It can analyze many samples including liquid, Films, pellets, biological fluids, tissue samples, pigments, inks, paints, semiconductors and the like.
    Analytical elements: atomic number 11-92., That Na-U.
    Features:
    Total reflectance fluorescence allows for simultaneous XRF (45 degree incidence) analysis; no memory effect, no matrix effect, complete suppression of the signal from the substrate, especially for thin film samples, powder samples, liquid sample analysis and testing; quantitative analysis of Common XRF simplicity; multi-element ultra-trace analysis (ppb-ppm orders of magnitude) with dynamic range from one part per million to one percent; non-destructive analysis without sample pretreatment; no liquid nitrogen cooling and low running costs A multi-purpose machine can not only analyze the crystal structure of the sample, but also analyze the composition and impurity content of the sample, and can also perform small-angle XRD diffraction to greatly reduce the equipment cost.
    Technical Parameters
    X-ray tube (domestic or imported)
    Target type: Cu, Fe, Co, Cr, Mo, Ag, W and other targets optional
    Focus: 1 × 10mm2 or 0.4 × 14mm2
    Maximum output power: 2.2kW or 2.4kW
    X-ray generator
    (PLC control)
    Maximum output power: 3kW
    X-ray tube voltage: 10 ~ 50kV
    X-ray tube current: 2 ~ 60mA
    Minimum voltage and current control step width: 1kV / step, 1mA / step
    Output stability: ≤ 0.01% (power fluctuations of 10%)
    Goniometer
    Goniometer structure: vertical goniometer θs-θd structure
    Goniometer scanning radius: Standard 225mm (150 ~ 225mm adjustable)
    Scanning range: -35 ° ~ 170 °
    Scanning speed: 0.006 ~ 120 ° / min
    Scanning method: θs-θd linkage, θs or θd single action
    Work: step, continuous, sub-scan
    Minimum step angle: 0.0001 °
    Measurement accuracy: ≤ 0.0002 °
    2θ angle repeatability: 0.0005 °
    Angle positioning speed: 1500 ° / min (2θ)
    Recording control unit
    (detector)
    Detector Type: SDD Detector for Proportional (PC) or Scintillation (SC) Fluorescence
    Maximum linear count rate: 1 × 107CPS (noise ≤ 1CPS)
    Spectral resolution: ≤20% (PC) or ≤50% (SC) ≤12% (SDD)
    Work: PLC automatic control differential, integral mode conversion, automatic PHA, dead time correction
    High pressure detector: 0 ~ 2100VDC or 0 ~ 1100VDC continuously adjustable
    High pressure stability: better than 0.005%

  • Introduction:
    TF-5500 X-ray Diffraction / Total Reflection Fluorescence Spectrometer is a new generation multi-function analysis instrument newly developed by our company. It can perform both X-ray diffraction and total reflection fluorescence spectroscopy. It can analyze many samples including liquid, Films, pellets, biological fluids, tissue samples, pigments, inks, paints, semiconductors and the like.
    Analytical elements: atomic number 11-92., That Na-U.
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