SR-C Reflective Film Thickness Meter Optical Thin Film Thickness Measurement Analyzer

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SR-C reflective film thickness meter

Product ID：GJGGXJG024

Price: Please inquire PDF Format

Supply Ability:50 SETS/MON

Port:SHENZHEN

Product Introduction
Other information

Model NumberSR-C

Brand NameWUHANYIGUANG

Payment TermsTT，PAYPAL，Alibaba.com Pay

SR-C Reflective Film Thickness Meter
Product Introduction
The SR-C Reflective Film Thickness Meter is a compact, high-precision optical thin film measurement instrument based on the optical interference principle. By analyzing the interference spectrum generated between the reflected light from the film surface and the reflected light from the film-substrate interface, the instrument can accurately measure thin film thickness, optical parameters, and coating characteristics.
The SR-C optical film thickness analyzer provides a non-contact and non-destructive measurement solution for various thin films, coatings, and surface layers. With advanced algorithms supporting single-layer and multilayer film analysis, it offers fast measurement, high accuracy, and flexible configuration for research and industrial applications.
It is widely used for measuring dielectric films, organic films, inorganic films, metal coatings, protective coatings, semiconductor films, and optical coatings.

Performance Features
● Optical interference measurement technology for accurate film thickness analysis.
● Non-contact and non-destructive testing, protecting delicate samples.
● Supports analysis from single-layer films to multilayer thin film structures.
● Wide spectral range from visible light to near infrared.
● High-intensity halogen light source provides stable optical performance.
● Compact optical-mechanical-electrical integrated design with easy operation.
● Advanced analysis algorithms:
FFT analysis for thick films.
Curve fitting analysis for thin film physical parameters.
● Fast measurement speed with single measurement completed within 1 second.
● Flexible configuration and customized solutions available.

Working Principle
The SR-C Reflective Film Thickness Meter works based on the principle of optical interference spectroscopy.
When incident light reaches the thin film surface, part of the light is reflected from the upper surface, while another part enters the film and reflects from the film-substrate interface. The two reflected beams interfere with each other and generate characteristic interference spectra.
By analyzing these spectral patterns through advanced algorithms, the system calculates film thickness and optical properties accurately.
For different film structures, the instrument uses optimized analysis methods:
● FFT algorithm for thick film thickness calculation.
● Spectral curve fitting algorithm for thin film and multilayer parameter analysis.

Applications
The SR-C reflective film thickness analyzer is suitable for:

Industry	Applications
Semiconductor Industry	Wafer coating and thin film thickness measurement
Optical Coatings	Lens coatings, anti-reflection films, protective coatings
Electronics	Functional films and dielectric layer analysis
Solar Industry	Thin film photovoltaic material testing
Materials Research	New film material development
Chemical Industry	Polymer films and organic coating measurement
Surface Engineering	Metal coating and protective layer inspection
Laboratory Research	Thin film optical property analysis

Technical Specifications

Parameter	Specification
Model	SR-C Reflective Film Thickness Meter
Measurement Function	Reflectance and related optical parameters
Measurement Principle	Optical interference spectroscopy
Spectral Range	380–800nm / 650–1100nm (customizable)
Film Thickness Range	50nm–40μm
Single Measurement Time	≤1s
Repeatability Accuracy	0.1nm (100nm SiO₂ wafer, 30 measurements)
Absolute Accuracy	±1nm or 1% (film thickness dependent)
Spot Size	0.5–3mm
Incident Angle	Vertical incidence
Film Analysis Capability	Single-layer and multilayer films
Light Source	High-intensity halogen lamp
Measurement Type	Non-contact, non-destructive

SR-C Reflective Film Thickness Meter vs Traditional Thickness Measurement Methods

Feature	SR-C Optical Film Thickness Meter	Traditional Thickness Measurement Methods
Measurement Method	Optical interference spectroscopy	Mechanical or contact measurement
Sample Damage	Non-contact, non-destructive	Possible surface damage
Measurement Speed	≤1 second	Usually slower
Film Structure Analysis	Single and multilayer analysis	Often limited
Thickness Range	50nm–40μm	Depends on method
Sample Preparation	Minimal preparation required	Often requires preparation
Optical Property Analysis	Supported	Usually unavailable

FAQ
1. What is the measurement principle of the SR-C film thickness meter?
The instrument uses optical interference spectroscopy by analyzing interference patterns between reflected light from the film surface and film-substrate interface.
2. Is the SR-C thickness meter a contact measurement instrument?
No. It uses a non-contact and non-destructive optical measurement method, making it suitable for delicate coatings and thin films.
3. What film thickness range can the instrument measure?
The SR-C can measure film thickness from 50nm to 40μm.
4. Can it measure multilayer films?
Yes. The advanced analysis algorithms support both single-layer and multilayer thin film analysis.
5. How fast is the measurement process?
A single measurement can be completed within 1 second, making it suitable for efficient laboratory and production inspection.
6. What types of coatings can be analyzed?
It can measure dielectric coatings, organic films, inorganic films, metal films, optical coatings, and various protective layers.

Product Summary
The SR-C Reflective Film Thickness Meter is a compact and high-precision optical thin film thickness analyzer based on optical interference technology. With fast non-contact measurement, advanced film analysis algorithms, and support for single-layer and multilayer coatings, it provides an efficient solution for semiconductor, optical coating, electronics, materials research, and industrial quality control applications.

FAQ
1. What is the measurement principle of the SR-C film thickness meter?
The instrument uses optical interference spectroscopy by analyzing interference patterns between reflected light from the film surface and film-substrate interface.
2. Is the SR-C thickness meter a contact measurement instrument?
No. It uses a non-contact and non-destructive optical measurement method, making it suitable for delicate coatings and thin films.
3. What film thickness range can the instrument measure?
The SR-C can measure film thickness from 50nm to 40μm.
4. Can it measure multilayer films?
Yes. The advanced analysis algorithms support both single-layer and multilayer thin film analysis.
5. How fast is the measurement process?
A single measurement can be completed within 1 second, making it suitable for efficient laboratory and production inspection.
6. What types of coatings can be analyzed?
It can measure dielectric coatings, organic films, inorganic films, metal films, optical coatings, and various protective layers.