Smarc-III-PO Laser Interferometer

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Smarc-III-PO Laser Interferometer

Product ID：CLCDjggs010

Price: Please inquire PDF Format

Supply Ability:50SETS/MON

Port:SHENZHEN

Product Introduction
Other information

Model NumberSmarc-III-PO

Brand NameNJYINGTEFEI

Payment TermsTT，PAYPAL，Alibaba.com Pay

Smarc-III-PO Laser Interferometer

Product Introduction
The Smarc-III-PO Laser Interferometer is designed for the online inspection of small flat optical surfaces. It is particularly suitable for measuring the wavefront distortion of mobile phone panels and 3D cover glass.
Featuring a high-precision reference surface with accuracy up to λ/20, a 635 nm semiconductor laser, and advanced phase-shifting data analysis software, the Smarc-III-PO provides reliable and repeatable optical surface measurement. Its larger and clearer imaging system, integrated workstation, Gigabit Ethernet CCD, and 15-inch LCD display make operation convenient for laboratory testing and production-line quality control.

Key Features
• High-precision reference surface: Flatness accuracy up to λ/20.
• Designed for small flat surfaces: Suitable for online optical surface inspection.
• Wavefront distortion measurement: Ideal for mobile phone panels and 3D cover glass.
• High repeatability: PV better than λ/50 and RMS better than λ/100.
• Clear imaging: Gigabit Ethernet CCD provides larger and clearer images.
• Integrated workstation: Compact and convenient for daily measurement.
• Advanced analysis software: Supports phase-shifting interferometric data processing.
• Compact structure: Lightweight design for flexible installation and use.

Working Principle
The Smarc-III-PO laser interferometer uses a 635 nm semiconductor laser to generate a coherent light beam. The beam is directed toward the measured surface and compared with a high-precision reference surface.
The reflected light beams produce an interference pattern. Any deviation in the tested surface causes changes in the interference fringes. The integrated CCD captures these patterns, while the phase-shifting data processing software analyzes the fringe information to calculate parameters such as:
• Surface wavefront distortion
• Peak-to-Valley (PV) value
• RMS value
• Surface flatness deviation
This enables fast, non-contact, and high-precision inspection of small flat optical components.

Technical Parameters

Parameter	Specification
Model	Smarc-III-PO
Measurement Application	Small flat surface online inspection
Light Source	Semiconductor laser
Wavelength	λ = 635 nm
Laser Warranty	1.5 years
Effective Beam Diameter	φ25 mm
Reference Surface Accuracy	λ/20
Measurement Accuracy	PV better than λ/20
Measurement Repeatability	PV better than λ/50
RMS Repeatability	RMS better than λ/100
Imaging System	Gigabit Ethernet CCD
Display	15-inch LCD monitor
Data Analysis	Phase-shifting interferometric data processing software
Dimensions	260 × 160 × 330 mm
Weight	6.5 kg
Power Supply	220 V, 55 Hz

Applications
The Smarc-III-PO laser interferometer is suitable for:
• Mobile phone panel inspection
• 3D cover glass testing
• Small flat optical component inspection
• Optical glass surface measurement
• Wavefront distortion analysis
• Precision optical component quality control
• Online production inspection
• Laboratory optical surface testing

Comparison: Smarc-III-PO vs. Conventional Surface Inspection Methods

Feature	Smarc-III-PO Laser Interferometer	Conventional Surface Inspection
Measurement Method	Non-contact laser interferometry	Contact or conventional optical inspection
Reference Accuracy	Up to λ/20	Typically lower precision
Repeatability	PV < λ/50, RMS < λ/100	More dependent on operator and equipment
Wavefront Analysis	Direct quantitative analysis	Often limited or indirect
Imaging	Gigabit Ethernet CCD	Standard imaging system
Online Inspection	Suitable	May require additional integration
Data Processing	Phase-shifting software	Basic measurement or manual evaluation
Application	Small flat surfaces and cover glass	General surface inspection

Compared with conventional surface inspection methods, the Smarc-III-PO laser interferometer provides higher precision, better repeatability, non-contact measurement, and quantitative wavefront analysis, making it especially suitable for precision optical surfaces and electronic display-related components.

Frequently Asked Questions (FAQ)
1. What is the Smarc-III-PO laser interferometer used for?
It is mainly used for online inspection of small flat surfaces and for measuring wavefront distortion in products such as mobile phone panels and 3D cover glass.
2. What is the measurement accuracy?
The instrument provides PV accuracy better than λ/20, supported by a high-precision λ/20 reference surface.
3. What wavelength does the laser interferometer use?
The Smarc-III-PO uses a 635 nm semiconductor laser.
4. Can it measure 3D cover glass?
Yes. The system is designed for wavefront distortion measurement of mobile phone panels and 3D cover glass.
5. What is the effective beam diameter?
The effective laser beam diameter is φ25 mm, making the instrument suitable for small optical surfaces.
6. How repeatable is the measurement?
The measurement repeatability is better than λ/50 PV, while RMS repeatability is better than λ/100.
7. Does the instrument include imaging and display functions?
Yes. It is equipped with a Gigabit Ethernet CCD and a 15-inch LCD display for clear image observation and measurement.
8. What software is used for data analysis?
The system uses dedicated phase-shifting interferometric data processing software to analyze interference patterns and calculate optical surface parameters.
9. Is the Smarc-III-PO suitable for production-line inspection?
Yes. Its compact structure, integrated workstation, clear imaging, and fast data processing make it suitable for online inspection and quality control applications.

Frequently Asked Questions (FAQ)
1. What is the Smarc-III-PO laser interferometer used for?
It is mainly used for online inspection of small flat surfaces and for measuring wavefront distortion in products such as mobile phone panels and 3D cover glass.
2. What is the measurement accuracy?
The instrument provides PV accuracy better than λ/20, supported by a high-precision λ/20 reference surface.
3. What wavelength does the laser interferometer use?
The Smarc-III-PO uses a 635 nm semiconductor laser.
4. Can it measure 3D cover glass?
Yes. The system is designed for wavefront distortion measurement of mobile phone panels and 3D cover glass.
5. What is the effective beam diameter?
The effective laser beam diameter is φ25 mm, making the instrument suitable for small optical surfaces.
6. How repeatable is the measurement?
The measurement repeatability is better than λ/50 PV, while RMS repeatability is better than λ/100.
7. Does the instrument include imaging and display functions?
Yes. It is equipped with a Gigabit Ethernet CCD and a 15-inch LCD display for clear image observation and measurement.
8. What software is used for data analysis?
The system uses dedicated phase-shifting interferometric data processing software to analyze interference patterns and calculate optical surface parameters.
9. Is the Smarc-III-PO suitable for production-line inspection?
Yes. Its compact structure, integrated workstation, clear imaging, and fast data processing make it suitable for online inspection and quality control applications.