Wavelength dispersion fluorescence spectrometer
Wavelength dispersion fluorescence spectrometer definition and principle

X-ray fluorescence spectrometry is a rapid and simultaneous determination of multiple elements of the instrument. Under the excitation of X-ray, the inner electron of the element to be detected undergoes an energy level transition and emits secondary X-ray, that is, X fluorescence.

The wavelength dispersion fluorescence spectrometer generally consists of a light source, a sample chamber, a spectroscopic crystal, a detection system and the like. The X-ray is irradiated on the sample, and the X-ray fluorescence generated by the X-ray fluorescence is emitted in all directions and a part thereof is generated after passing through the collimator The collimated light beams are radiated on the spectroscopic crystal. The crystal disperses the incident light according to the Bragg equation, and then receives the diffracted characteristic X-ray signals from the detection system. Based on the characteristic X-ray wavelengths generated by various elements and the intensities of the X-rays at various wavelengths , According to which qualitative analysis and quantitative analysis.

Wavelength dispersion spectrometer classification

One is the so-called scanning spectrometer, which measures each element one by one in an angular scanning order.
The other is the so-called multi-element simultaneous analytical X-ray fluorescence spectrometer with each element being equipped with a fixed goniometer and analyzing multiple elements simultaneously.
There is also a combination of the first two, both sequential scanners and various elements of the fixed analyzer.

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