HCX09A Thin Film Thermal Property Tester Introduction: This instrument is used to test the thermal properties of thin film materials. Thin film physics states that when an object is very thin, the physical properties of the same material in a thin film state may not necessarily be the same as those in a volumetric state. Therefore, the measurement of the physical properties of a thin film must be carried out in the thin film state. A transient experimental model based on the cosine (or sine) law of surface temperature variation of an object. The temperature wave method is used to test the thermal properties of thin film materials, as the thin film is a finite thickness one-dimensional model. In this state, when the temperature oscillation frequency reaches a certain value, the phase difference between the upper and lower surface temperatures of the sample is used to calculate the thermal conductivity or thermal conductivity. The instrument is dedicated to studying the thermal properties of thin film materials. Technical parameters: 1. Thermal conductivity range: 0.05-20w/m · k 2. The instrument realizes digital temperature measurement with an accuracy better than 0.2 level. 3. Measurement results with an accuracy of ± 3% 4. The metering heating power can be adjusted by ± 1%. 5. Sample size requirement: Cylinder ￠ 15-30 * 5-30mm 6. Temperature and protective atmosphere are customized according to user requirements. 7. Connect to a computer to achieve fully automated testing and analysis.
Introduction: This instrument is used to test the thermal properties of thin film materials. Thin film physics states that when an object is very thin, the physical properties of the same material in a thin film state may not necessarily be the same as those in a volumetric state. Therefore, the measurement of the physical properties of a thin film must be carried out in the thin film state. A transient experimental model based on the cosine (or sine) law of surface temperature variation of an object. The temperature wave method is used to test the thermal properties of thin film materials, as the thin film is a finite thickness one-dimensional model. In this state, when the temperature oscillation frequency reaches a certain value, the phase difference between the upper and lower surface temperatures of the sample is used to calculate the thermal conductivity or thermal conductivity. The instrument is dedicated to studying the thermal properties of thin film materials.
