| Wavelength range | 190—900nm |
| wavelength accuracy | ±0.2nm |
| baseline drift | <0.004A/30min |
| Resolution | <0.2nm |
| Characteristics of the concentration of Cu | <0.02μg/ml/1% |
| Buckle background ability | >30 |
| Detection LimitCu | <0.005μg/ml |
| density measurement(RSD) | <0.8%(Cu) |
| Wavelength Repeatability | <0.1nm |