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GDAT-S Low Frequency Dielectric Constant Tester

Product ID:WQjdcs019

Price: Please inquire PDF Format
Supply Ability:50 SETS/MON
Port:SHENZHEN
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  • Product Introduction
  • Consulting
  • Model NumberGDAT-S
    Brand NameBEIGUANGJINGYI
    Payment TermsTT,PAYPAL
    GDAT-S Low Frequency Dielectric Constant Tester
     
    Introduction:
    Overview of Low Frequency Dielectric Constant Tester GDAT-S is a new impedance analyzer with multiple functions and higher test frequencies. It is small in size, compact and portable, and is easy to use on the shelf. The basic accuracy of this series of instruments is 0.05%, the resolution of the test frequency is 1MHz10mHz, and the 4.3-inch LCD screen is matched with the Chinese and English operation interface, which is convenient and simple to operate. The transformer test function and balance test function are integrated to improve the test efficiency. The instrument provides a wealth of interfaces, which can meet various requirements of automatic sorting test, data transmission and storage.
    Features
    1. 4.3-inch TFT LCD display with optional operation interface in Chinese and English
    2. Test frequency up to 1MHz, 10mHz resolution
    3. Balance test function Transformer parameter test function
    4. Maximum test speed: 13ms/time
    5. Automatic level adjustment (ALC) function of voltage or current
    6. V, I test signal level monitoring function
    7. Internal DC bias source can be externally connected with high current DC bias source
    Technical parameter
    Display: 480×RGB×272, 4.3-inch TFT LCD display.
    Test signal frequency: 20Hz—1MHz
    Minimum resolution: 10mHz, 4 digits Frequency input accuracy: 0.01% AC level Test signal voltage range: 10mV—2Vrms voltage Minimum resolution: 100μV, 3 digits input
    Accuracy ALC ON 10% x set voltage + 2mVALC OFF 6% x set voltage + 2mV
    Test signal current range: 100μA—20mA
    Current minimum resolution: 1μA, 3-bit input accuracy ALC ON 10% x set current + 20μ AALC OFF 6% x set voltage + 20μADC
    Bias voltage source voltage/current range: 0V—±5V/0mA—±50mA Resolution: 0.5mV/5μA Voltage accuracy: 1% x set voltage +
    5mVISO ON: for inductance, transformer plus bias test AC source internal resistance ISO ON: 100ΩISO OFF30Ω50Ω, 100Ω optional
    DCR source internal resistance: 30Ω, 50Ω, 100Ω
    Optional impedance test parameters: |Z|, |Y|, C, L, X, B, R,G, D, Q,θ, DCR, Vdc-Idc
    Test page parameter display: a set of main and auxiliary parameters; 10-point list scan
    Transformer test parameters: DCR1 (primary, 2 terminals), DCR2 (secondary, 2 terminals), M (mutual inductance), N, 1/N, Phase (phase), Lk (leakage inductance), (primary and secondary capacitance) , the balance test.
    Basic measurement
    Accuracy
    Impedance test parameters: 0.05% N: 0.1% calibration conditions
    Preheating time: ≥30 minutes;
    Ambient temperature: 23±5ºC;
    Signal voltage: 0.3Vrms-1Vrms;
    Clear to "0": after OPEN and SHORT;
    Test cable length: 0 m
    Measurement time (≥10 kHz): fast: 13 ms/time, medium speed: 67 ms/time, slow speed: 187 ms/time, plus display character refresh time
    General technical parameters
    Working temperature, humidity: 040, ≤ 90%RH
    Power supply voltage: 220V±20%, 50Hz±2Hz power consumption 80VA
    Volume (W×H×D): 280 mm × 88 mm × 370
    mm (without jacket), 369 mm × 108 mm × 408 mm (with jacket).
    Weight: about 5kg
  • Introduction:
    Overview of Low Frequency Dielectric Constant Tester GDAT-S is a new impedance analyzer with multiple functions and higher test frequencies. It is small in size, compact and portable, and is easy to use on the shelf. The basic accuracy of this series of instruments is 0.05%, the resolution of the test frequency is 1MHz10mHz, and the 4.3-inch LCD screen is matched with the Chinese and English operation interface, which is convenient and simple to operate. The transformer test function and balance test function are integrated to improve the test efficiency. The instrument provides a wealth of interfaces, which can meet various requirements of automatic sorting test, data transmission and storage.
     
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