FTPL10 Fourier Transform Photoluminescence Spectrometer

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FTPL10 Fourier Transform Photoluminescence Spectrometer

Product ID：FGhw047

Price: Please inquire PDF Format

Supply Ability:50 SETS/MON

Port:SHENZHEN

Product Introduction
Other information

Model NumberFTPL10

Brand NameSHYINGSA

Payment TermsTT，PAYPAL，Alibaba.com Pay

FTPL10 Fourier Transform Photoluminescence Spectrometer
Product Overview
The FTPL10 Fourier Transform Photoluminescence Spectrometer is a high-sensitivity infrared photoluminescence (PL) measurement system designed for weak-signal detection in semiconductor, optoelectronic, and advanced photonic materials. Using Fourier transform interferometric spectroscopy, FTPL10 provides high optical throughput, low equivalent noise, fast spectral acquisition, and enhanced infrared detection sensitivity compared with conventional dispersive spectrometers.
Photoluminescence spectroscopy is widely used as a non-destructive analytical technique for semiconductor bandgap characterization, impurity and defect analysis, recombination mechanism studies, and material quality evaluation. Infrared PL measurements, however, often involve extremely weak optical signals and traditionally require complex optical alignment and considerable experimental experience.
FTPL10 addresses these challenges with a pre-optimized optical design and dedicated weak infrared signal detection technology. The system provides an effective spectral measurement range of 4000–12500 cm⁻¹ (800–2500 nm), continuously adjustable excitation laser power, and sample temperature control from room temperature down to approximately 77 K, making it suitable for advanced semiconductor and infrared optoelectronic research.

Key Features
• High-Sensitivity Weak Infrared Signal Detection
FTPL10 uses Fourier transform interferometric spectroscopy for signal acquisition. Unlike conventional dispersive spectrometers, the system does not rely on narrow entrance and exit slits that significantly restrict optical throughput.
The high-throughput optical design increases the amount of collected light and eliminates the need for wavelength-by-wavelength spectral dispersion. This significantly improves the detection capability for weak infrared PL signals, with spectral resolution and signal-to-noise performance improved by approximately one order of magnitude under suitable measurement conditions.
• Fast Spectral Acquisition
FTPL10 can acquire a high-quality spectrum in less than 1 second under commonly used spectral resolution conditions. Multiple rapid scans can be performed and averaged to reduce random errors and further improve the signal-to-noise ratio.
This fast acquisition capability is particularly useful for repeated measurements, process monitoring, comparative material studies, and measurements where signal stability is important.
• Easy Optical Alignment and Operation
FTPL10 incorporates a pre-optimized collimated optical path that directs the excitation laser to a predefined sample position, which is also optimized for PL signal collection.
Users do not need to perform complicated optical-path adjustments. After fixing the sample, the three-dimensional translation stage can be used to position the sample at the preset measurement location. The system therefore has a relatively low operating threshold and can be used after basic training.
• Flexible Excitation Configuration
The standard configuration uses a 532 nm excitation laser, while a 671 nm excitation laser is available as an optional configuration. Excitation power can be adjusted according to sample characteristics and measurement requirements.
• Low-Temperature Photoluminescence Measurement
FTPL10 supports low-temperature PL measurements using a cryogenic sample environment. The standard dewar operates below 85 K, enabling low-temperature characterization of semiconductor and optoelectronic materials.

Working Principle
FTPL10 uses Fourier transform interferometric spectroscopy to measure photoluminescence signals.
During measurement, the excitation laser irradiates the sample and stimulates the sample to generate photoluminescence. The emitted PL signal is collected through the optimized optical path and introduced into the Fourier transform interferometer.
The interferometer modulates the optical signal and records the resulting interferogram. A Fourier transform is then applied to the interferogram to obtain the corresponding optical spectrum.
Compared with conventional dispersive spectrometers, the Fourier transform approach provides high optical throughput and rapid broadband spectral acquisition. These characteristics make FTPL10 particularly suitable for weak infrared PL signals, where maximizing collected photons and minimizing equivalent noise are critical.

Technical Specifications

Parameter	FTPL10 Specification
Spectrometer Principle	Fourier Transform Interferometric Spectroscopy
Spectral Measurement Range	4000–12500 cm⁻¹
Equivalent Wavelength Range	800–2500 nm
Spectral Resolution	Better than 2 cm⁻¹
Signal-to-Noise Ratio	Better than 500
Spectral Acquisition Speed	Up to 1 spectrum per second
Standard Excitation Laser	532 nm
Standard Excitation Laser Power	5–100 mW
Optional Excitation Laser	671 nm
Optional Excitation Laser Power	5–50 mW
Standard Dewar	Operating temperature below 85 K
Dewar Hold Time	More than 4 hours
Cold Head Diameter	30 mm
Stability	Better than 1% (rms @ 4 h)
Optional Dewar	OptistatDN, Oxford Instruments

Applications
• Advanced optoelectronic materials research
• Semiconductor wafer quality inspection
• Semiconductor bandgap characterization
• Semiconductor impurity and defect analysis
• Recombination mechanism studies
• Rare-earth luminescent material characterization
• Infrared optoelectronic device quality inspection
• Infrared photoluminescence research
• Low-temperature photoluminescence measurement

Application Scenarios
Semiconductor Materials Research
FTPL10 can be used to characterize the photoluminescence response of semiconductor materials, including bandgap-related emission, defects, impurities, and recombination behavior.
Semiconductor Wafer Inspection
The high sensitivity of FTPL10 makes it suitable for evaluating PL characteristics and material uniformity during semiconductor wafer quality inspection.
Infrared Optoelectronic Materials
The 800–2500 nm measurement range covers an important infrared and near-infrared region, making the instrument suitable for research and quality evaluation of infrared optoelectronic materials and devices.
Rare-Earth Luminescent Materials
FTPL10 can be used to investigate the emission characteristics and spectral response of rare-earth-doped and other luminescent materials.
Low-Temperature PL Research
The cryogenic sample environment enables photoluminescence measurements under low-temperature conditions, supporting studies of temperature-dependent emission behavior and material properties.

FTPL10 vs. Conventional Dispersive Photoluminescence Spectrometers

Feature	FTPL10 Fourier Transform PL Spectrometer	Conventional Dispersive PL Spectrometer
Spectral Measurement Method	Fourier transform interferometry	Dispersive spectral separation
Optical Throughput	High	Limited by optical slits
Weak Infrared Signal Detection	Excellent	More challenging
Spectral Acquisition	Broadband rapid acquisition	Sequential wavelength scanning
Measurement Speed	Up to 1 spectrum/s	Generally slower
Optical Alignment	Pre-optimized optical path	May require more complex adjustment
User Skill Requirement	Relatively low	Relatively high
Low-Temperature Measurement	Supported	Depends on system configuration
Infrared PL Application	Particularly suitable	Suitable depending on detector and optical configuration

FAQ
What is the FTPL10 Fourier Transform Photoluminescence Spectrometer used for?
FTPL10 is primarily used for weak infrared photoluminescence measurement and characterization of semiconductor, optoelectronic, and luminescent materials. Typical applications include bandgap analysis, defect characterization, recombination studies, wafer quality inspection, and infrared device evaluation.
What wavelength range can FTPL10 measure?
FTPL10 has an effective spectral measurement range of 4000–12500 cm⁻¹, corresponding approximately to 800–2500 nm.
What excitation lasers are available?
The standard configuration uses a 532 nm excitation laser with an adjustable power range of 5–100 mW. A 671 nm excitation laser with a power range of 5–50 mW is available as an option.
Can FTPL10 perform low-temperature photoluminescence measurements?
Yes. The system can be configured with a cryogenic dewar for low-temperature measurements. The standard dewar operates below 85 K, with a hold time of more than 4 hours.
How fast can FTPL10 acquire a spectrum?
Under commonly used resolution conditions, FTPL10 can acquire a high-quality spectrum in less than 1 second, with a maximum acquisition speed of approximately 1 spectrum per second.
Does FTPL10 require complicated optical alignment?
No. FTPL10 uses a pre-optimized optical path that directs the excitation light to a predefined sample position and simultaneously provides an optimized PL collection position. Users mainly need to fix the sample and adjust its position using the three-dimensional translation stage.
Why is Fourier transform spectroscopy suitable for weak infrared PL signals?
Fourier transform spectroscopy provides high optical throughput because it avoids the narrow slits used in conventional dispersive spectrometers. It can collect a broader range of optical information simultaneously, which is advantageous for weak infrared signal detection and can improve measurement sensitivity and signal-to-noise performance.
Who is FTPL10 suitable for?
FTPL10 is suitable for universities, research institutes, semiconductor laboratories, optoelectronic material manufacturers, semiconductor wafer inspection laboratories, and R&D organizations working with infrared photoluminescence and advanced optical materials.

FAQ
What is the FTPL10 Fourier Transform Photoluminescence Spectrometer used for?
FTPL10 is primarily used for weak infrared photoluminescence measurement and characterization of semiconductor, optoelectronic, and luminescent materials. Typical applications include bandgap analysis, defect characterization, recombination studies, wafer quality inspection, and infrared device evaluation.
What wavelength range can FTPL10 measure?
FTPL10 has an effective spectral measurement range of 4000–12500 cm⁻¹, corresponding approximately to 800–2500 nm.
What excitation lasers are available?
The standard configuration uses a 532 nm excitation laser with an adjustable power range of 5–100 mW. A 671 nm excitation laser with a power range of 5–50 mW is available as an option.
Can FTPL10 perform low-temperature photoluminescence measurements?
Yes. The system can be configured with a cryogenic dewar for low-temperature measurements. The standard dewar operates below 85 K, with a hold time of more than 4 hours.
How fast can FTPL10 acquire a spectrum?
Under commonly used resolution conditions, FTPL10 can acquire a high-quality spectrum in less than 1 second, with a maximum acquisition speed of approximately 1 spectrum per second.
Does FTPL10 require complicated optical alignment?
No. FTPL10 uses a pre-optimized optical path that directs the excitation light to a predefined sample position and simultaneously provides an optimized PL collection position. Users mainly need to fix the sample and adjust its position using the three-dimensional translation stage.
Why is Fourier transform spectroscopy suitable for weak infrared PL signals?
Fourier transform spectroscopy provides high optical throughput because it avoids the narrow slits used in conventional dispersive spectrometers. It can collect a broader range of optical information simultaneously, which is advantageous for weak infrared signal detection and can improve measurement sensitivity and signal-to-noise performance.
Who is FTPL10 suitable for?
FTPL10 is suitable for universities, research institutes, semiconductor laboratories, optoelectronic material manufacturers, semiconductor wafer inspection laboratories, and R&D organizations working with infrared photoluminescence and advanced optical materials.