Introduction:
Multi-mode AFM has a wide range of applications, including:
Material science: observing and studying material surfaces, including surface roughness and surface structure, particle size, and defects;
Microelectronics: On-line detection of large-scale integrated circuits, studying the local electrical characteristics of ICs, and being used for information storage and reading of ultra-high-density (100 million times that of current disks)
Biology: DNA, chromatin structure, protein/enzyme reactions, protein adsorption, etc.
Medicine: a powerful means of mesoscopic operation, its application areas involve medicine, pharmacology, immunity, diagnosis and treatment and other disciplines
Optics: The combination of optical technology and AFM technology can form a new discipline; near-field optics, which combines the unparalleled resolution of AFM technology in detecting topography with the advantages of optical field observations.
Physics: AFM can detect the surface's electronic structure, energy level, wave function, tunneling effect and so on. Mesoscopic physics studies can be conducted to study the interaction of electrons with adsorbed atoms
Chemistry: AFM can be used as an effective in-situ detection tool to study surface chemical reactions at the atomic level. It can also observe atomic-level changes in surface chemical reactions. Features:
1. Miniaturized and detachable design, easy to carry and classroom teaching;
2. The detection head is integrated with the sample scanning table, stable and reliable;
3. The uniaxially driven sample automatically approaches the probe vertically, accurately positions the scanning area, and makes the needle tip scan perpendicular to the sample;
4. The motor controls the intelligent needle detection method for automatic detection of pressure ceramics to protect the probe and sample;
5. Lateral CCD observation system, real-time observation of the needle into the needle state and positioning of the sample scanning area;
6. Spring suspension type shockproof method, simple and practical, good shockproof effect;
7. Integrated scanner hardware nonlinear correction user editor, nano characterization and measurement accuracy better than 98%. Technical Parameters
Working mode: Constant high mode, constant current mode
Sample size: Φ ≤ 90mm, H ≤ 20mm
Scan range: XY to 1000nm, Z to 200nm
Scanning resolution: XY to 0.05nm, Z to 0.01nm
Sample movement range: 0~13mm
Optical magnification 4X, optical resolution 2.5um
Scan rate 0.6Hz~4.34Hz, scan angle 0~360°
Scan Control: XY uses 18-bit D/A, Z uses 16-bit D/A
Data sampling: 14-bit A/D, dual 16-bit A/D multiplex simultaneous sampling
Feedback method: DSP digital feedback
Feedback sampling rate: 64.0KHz
Communication interface: USB2.0/3.0
Operating environment: WindowsXP/7/8/10 operating system
Introduction:
Multi-mode AFM has a wide range of applications, including:
Material science: observing and studying material surfaces, including surface roughness and surface structure, particle size, and defects;
Microelectronics: On-line detection of large-scale integrated circuits, studying the local electrical characteristics of ICs, and being used for information storage and reading of ultra-high-density (100 million times that of current disks)
Biology: DNA, chromatin structure, protein/enzyme reactions, protein adsorption, etc.
Medicine: a powerful means of mesoscopic operation, its application areas involve medicine, pharmacology, immunity, diagnosis and treatment and other disciplines
Optics: The combination of optical technology and AFM technology can form a new discipline; near-field optics, which combines the unparalleled resolution of AFM technology in detecting topography with the advantages of optical field observations.
Physics: AFM can detect the surface's electronic structure, energy level, wave function, tunneling effect and so on. Mesoscopic physics studies can be conducted to study the interaction of electrons with adsorbed atoms
Chemistry: AFM can be used as an effective in-situ detection tool to study surface chemical reactions at the atomic level. It can also observe atomic-level changes in surface chemical reactions.
