FM-NanoviewRa-AFM atomic force microscopy laser Raman integrated instrument Introduction: The Atomic Force Microscope-Laser Raman Integrated System (FM-Nanoview Ra-AFM) features an integrated design of an optical microscope, atomic force microscope, and Raman spectrometer, offering powerful functionality. Features: 1. The integrated design of optical microscope, atomic force microscope, and Raman spectrometer provides powerful functionality 2. It possesses imaging capabilities of both optical microscope and atomic force microscope, as well as Raman spectroscopy analysis, without any interference between them 3. It possesses both optical two-dimensional measurement and atomic force microscopy three-dimensional measurement capabilities 4. The laser detection head and sample scanning platform are integrated into one unit, boasting a very stable structure and strong anti-interference capability 5. Precise probe positioning device, with very simple laser spot alignment adjustment 6. The single-axis drive system automatically brings the probe into vertical proximity to the sample, ensuring that the probe tip scans perpendicular to the sample 7. Intelligent needle insertion method utilizing motor control, piezoelectric ceramic automatic detection, and protection for both the probe and sample 8. Ultra-high magnification optical positioning system, enabling precise positioning of the probe and sample scanning area 9. Integrated scanner non-linear correction user editor, with nanoscale characterization and measurement accuracy exceeding 98% 10. Supports multiple wavelengths including 405nm, 532nm, 633nm, 785nm, 830nm, and 1064nm Technical Specifications: Atomic force microscope: Operating modes: Contact mode, tapping mode Configuration modes: Friction/Lateral force, Amplitude/Phase, Magnetic force/Electrostatic force Force spectrum curve: F-Z force curve, RMS-Z curve XY scanning range: 50×50um, optional 20×20um, 100×100um Z-scan range: 5um, optional 2.5um, 10um Scanning resolution: 0.2nm in lateral direction, 0.05nm in longitudinal direction Sample size: Φ≤68mm, H≤20mm Sample stage travel: 25×25mm Optical objective lens: 5X/10X/20X/50X flat-field apochromatic objective lens Optical eyepiece: 10X Illumination method: Kohler illumination system Optical focusing: coarse and fine manual focusing Camera: 5 million pixel CMOS sensor Display screen: 10.1-inch flat panel display with image measurement function Scanning rate: 0.6Hz~30Hz Scanning angle: 0~360° Operating environment: Windows XP/7/8/10 operating system Communication interface: USB2.0/3.0 Raman: Raman spectroscopy range: 200-3600 cm-1 Resolution: <15cm-1@25μm slit Laser: 532±1nm, linewidth ≤0.2nm (lasers of different wavelength bands are available as options) Laser power stability: ≤3% P-P (@2hrs) Output power: adjustable from 0-100mW Laser cutoff depth of filter: OD8 Operating temperature: 0-40℃ Operating humidity: 5-80% Laser lifespan: 5000 hours
FM-NanoviewRa-AFM atomic force microscopy laser Raman integrated instrument Introduction: The Atomic Force Microscope-Laser Raman Integrated System (FM-Nanoview Ra-AFM) features an integrated design of an optical microscope, atomic force microscope, and Raman spectrometer, offering powerful functionality.
