Position: Home > > Optical instruments and equipment > Electron microscope > AFM Atomic Force Microscope > FM-Nanoview LS-AFM Industrial Atomic Force Microscope for Nanoscience Research

FM-Nanoview LS-AFM Industrial Atomic Force Microscope for Nanoscience Research

Product ID:GDXyzl007

Price: Please inquire PDF Format
Supply Ability:10 SETS/MONTH
Port:SHENZHEN
share:
  • Product Introduction
  • Consulting
  • Model NumberFM-Nanoview LS-AFM
    Brand NameFSM
    Payment TermsT/T, paypal
    Features:
    1. The first domestic AFM to realize that the sample remains stationary and the probe moves to scan;
    2. The first company in China to use closed-loop three-axis independent piezoelectric translating scanner to scan a wide range of high precision;
    3. The size and weight of the sample are basically unlimited, especially suitable for the detection of large samples such as integrated circuit wafers;
    4. Gantry scanning head design, marble base, vacuum adsorption stage;
    5. Over-travel 2-D electric sample mobile station to quickly select the sample area of ​​interest;
    6. High-power optical positioning system to achieve precise positioning of the probe and sample scanning area;
    7. Simple laser spot adjustment method, which can observe and adjust light spot in real time through optical CCD window;
    8. The single-axis drive scanning head automatically approaches the sample vertically, accurately positions the scanning area, and the needle tip is perpendicular to the sample scanning;
    9. Motor control pressure electric ceramic automatic detection intelligent needle, protect the probe and sample;
    10. Equipped with a closed metal shield, pneumatic shock-absorbing platform, strong anti-interference ability, does not affect the operation of the instrument;
    11. Integrated Scanner Hardware Non-linear calibration user editor, Nano characterization and measurement accuracy better than 98%.
    Technical Parameters  
    Basic operating modes: contact, tap, F-Z force curve measurement, RMS-Z curve measurement, friction/lateral force, amplitude/phase, magnetic force and electrostatic force
    Optional Work Mode: Profile Line Fast Measurement Mode
    The largest sample size: Φ ≥ 300mm, H ≥ 50mm
    Closed-loop scanning range: XY to 100um, Z to 10um
    Closed-loop scanning resolution: XY to 0.2nm, Z to 0.05nm
    Sample movement range: 300mm×300mm
    Auxiliary optical positioning: 10X objective lens, optical resolution 1um (optional 20X, optical resolution 0.8um)
    Pneumatic shock absorbing table, damping frequency 0.5Hz
    Noise level: <0.1nm
    Scan rate 0.6Hz~4.34Hz, scan angle 0~360°
    Scan Control: XY uses 18-bit D/A, Z uses 16-bit D/A
    Data sampling: 14-bit A/D, dual 16-bit A/D multiplex simultaneous sampling
    Feedback method: DSP digital feedback
    Feedback sampling rate: 64.0KHz
    Communication interface: USB2.0/3.0
    Operating environment: WindowsXP/7/8/10 operating system
     

  • Features:
    1. The first domestic AFM to realize that the sample remains stationary and the probe moves to scan;
    2. The first company in China to use closed-loop three-axis independent piezoelectric translating scanner to scan a wide range of high precision;
    3. The size and weight of the sample are basically unlimited, especially suitable for the detection of large samples such as integrated circuit wafers;
    4. Gantry scanning head design, marble base, vacuum adsorption stage;
    5. Over-travel 2-D electric sample mobile station to quickly select the sample area of ​​interest;
    6. High-power optical positioning system to achieve precise positioning of the probe and sample scanning area;
    7. Simple laser spot adjustment method, which can observe and adjust light spot in real time through optical CCD window;
    8. The single-axis drive scanning head automatically approaches the sample vertically, accurately positions the scanning area, and the needle tip is perpendicular to the sample scanning;
    9. Motor control pressure electric ceramic automatic detection intelligent needle, protect the probe and sample;
    10. Equipped with a closed metal shield, pneumatic shock-absorbing platform, strong anti-interference ability, does not affect the operation of the instrument;
    11. Integrated Scanner Hardware Non-linear calibration user editor, Nano characterization and measurement accuracy better than 98%.
Products
Analytical instruments
Physical property test
Environmental monitoring and analysis
Lab general equipment
About us
About this website
Our service
Product purchase
Contact Us

Newsletter

Make Sure you dont miss interesting happenings by joining our newsletter program.

Contact Us
18620722006
instruments@instrumentstrade.com