FM-Nanoview EC-AFM Environmentally Controlled Atomic Force Microscope Introduction: The Environmentally Controlled Atomic Force Microscope (FM-Nanoview EC-AFM) possesses both optical microscope and atomic force microscope imaging capabilities, allowing both to operate simultaneously without interference. Features: 1. The integrated design of optical metallurgical microscope and atomic force microscope offers powerful functionality 2. It possesses both optical microscope and atomic force microscope imaging capabilities, allowing both to operate simultaneously without interfering with each other 3. It can operate simultaneously in ordinary air environment, liquid environment, temperature-controlled environment, and inert gas-controlled environment 4. The sample scanning platform and laser detection head feature a sealed design, allowing for the filling and evacuating of special gases internally, eliminating the need for additional sealing covers 5. The laser detection system adopts a vertical optical path design, which, coupled with a gas-liquid dual-purpose probe holder, enables operation under liquid conditions 6. The single-axis drive sample automatically approaches the probe vertically, ensuring that the probe tip scans perpendicular to the sample 7. Intelligent needle insertion method with motor control, piezoelectric ceramic automatic detection, and protection of probe and sample 8. Ultra-high magnification optical positioning system, enabling precise positioning of the probe and sample scanning area 9. Integrated scanner nonlinear correction user editor, with nanoscale characterization and measurement accuracy exceeding 98% Technical Specifications: Operating modes: Contact mode, tapping mode Configuration modes: Friction/Lateral force, Amplitude/Phase, Magnetic/Electrostatic force Force spectrum curve: F-Z force curve, RMS-Z curve Working environment: Air/liquid, inert gas, heating/cooling environment XY scanning range: 50×50um, optional 20×20um, 100×100um Z-scan range: 5um, with options of 2.5um and 10um Scanning resolution: 0.2nm in horizontal direction, 0.05nm in vertical direction Sample size: Φ≤68mm, H≤20mm Sample stage travel: 25×25mm Optical objective lens: 5X/10X/20X/50X flat field apochromatic objective lens Optical eyepiece: 10X Illumination method: Kohler illumination system Optical focusing: coarse and fine manual focusing Camera: 5 million pixel CMOS sensor Display screen: 10.1-inch flat panel display with image measurement function Heating device: Temperature control range: room temperature to 250℃ (optional) Combined heating and cooling station: Temperature control range -20℃~220℃ (optional) Scanning rate: 0.6Hz~30Hz Scanning angle: 0~360° Operating environment: Windows XP/7/8/10 operating system Communication interface: USB2.0/3.0
FM-Nanoview EC-AFM Environmentally Controlled Atomic Force Microscope Introduction: The Environmentally Controlled Atomic Force Microscope (FM-Nanoview EC-AFM) possesses both optical microscope and atomic force microscope imaging capabilities, allowing both to operate simultaneously without interference.
