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Flex One Microscope Photoluminescence Spectrometer for Materials Analysis

Product ID:FDqtOther009

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  • Product Introduction
  • Consulting
  • Model NumberFlex One
    Brand NameZLHG
    Payment TermsT/T, paypal
    Introduction
    Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields. 
    Flex One, the latest in microspectrometers is a fully integrated, versatile and cost effective microspectrometer that combines a microscope head directly coupled to a high-performance, triple gratings, imaging spectrometer 
    features

    The integration of optical layout -- all optical elements adjustments is only needed in the  initial            installation, to ensure the efficiency and easy using
    Double light path design – easy to switch the horizontal and vertical optical path, for application on all kinds of sample morphology
    Ultra-wide spectra range – 300-2200nm
    Video monitoring light path -- for accurate sampling point adjustment
    Unique correction function of Emission spectra -- to make the spectral measurements more accurate and comparable
    Multiple excitation wavelength
    option-- 325nm, 405nm, 442nm, 473nm, 532nm, 633nm, 785nm etc.
    Automatic mapping function
    option-- 50mm × 50mm measurement range, or customized special specifications
    Electroluminescent (EL) feature
    option-- extended options
    Microscopic Raman spectroscopy measurement
    option-- extended options
    Ultra low temperature measuring accessories
    option-- providing measurements at ultra low temperature under 10K
    *   optional items; please consult us for more details
    * * configuration shall be determined according to the actual needs.
    System composition
    1.        Excitation source part: lasers of various wavelengths from UV to near-infrared bands
    2.        Microscopic optical path part: specific microscopic optical path of optimization design
    3.        Spectra acquisition part: imaging calibrated spectral and high sensitive scientific grade CCD or single point detector and data acquisition device
    4.        Sample holder: XYZ three-dimensional adjustable sample holder (manual or automatic), ultra low temperature sample table

    Specification
    The main type Flex One
    The spectral range 300-2200nm
    Spectral resolution 0.1nm
    Excitation wavelength options 325nm, 405nm, 442nm, 473nm, 532nm, 633nm, 785nm etc.
    Detector Type cooled CCD
    (2000x256)
    cooled InGaAs
    (512x1)
    cooled InGaAs
    (512x1)
    Spectralrange 300-1000nm 800-1700nm 800-2200nm
    The spatial resolution 100um
    Note : All above are the basic specifications, detailed specifications varies from different configuration options, please consult us for details
    Application
    Function: Photoluminescence Spectrum Measurement
    Samples: GaN
    ZnOGaAsRare Earth and so on
    The Photoluminescence and Electroluminescence Spectrum Measurement of InGaN/GaN
     (Conditions: Excitation 325nm Laser with 30mW Power , Spectral Range
    340-700nm)
    PL Spectrum Measurement
    The red curve stands for Anode and the green curve stands for Cathode ;
    The photoluminescence peak of GaN/InGaN are 365nm and 475nm

  • Introduction
    Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields. 
    Flex One, the latest in microspectrometers is a fully integrated, versatile and cost effective microspectrometer that combines a microscope head directly coupled to a high-performance, triple gratings, imaging spectrometer 
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