CRA-31 High Temperature Resistance Measurement System characteristic: 1. Suitable for researching and developing the resistivity of various materials and thin film materials 2. Advanced application temperature control technology, real-time temperature program synchronous scanning 3. Free temperature rise/fall, precise temperature control program, data measurement during heating, constant temperature and cooling processes 4. Automatic pressure safety protection design ensures that there will be no explosion during the testing process 5. The sample holder adopts a unique contact balancing mechanism to ensure high reproducibility of measurement 6. Optional original sheet sample measurement system 7. Optional advanced data acquisition technology to avoid interference errors caused by circuit board data acquisition technology Technical parameters: Model: CRA-31 Measurement range: 0.1 Mohm-1 Kohm; 0.1 Mohm-10 Mohm (high resistance module) Accuracy: 5% Measurement method: Four terminal method Resolution: 10 nOhm Temperature range: -100 ° C up to 500 ° C; RT up to 800 ° C/1150 ° C Temperature control rate: 0.01-100 K/min Temperature control accuracy:+/-0.5K Current: 0 to 160 mA Atmosphere: decompression He, oxidation, reduction, vacuum Sample size: diameter or square: 2 to 4 mm; Length: 6 to 22 mm Circular sample: diameter: 10-12.7-25.4 mm Host size: 106 × 54 × 1450mm Power: 4800W (800 ℃); 6000W（1150℃） Power supply: 220V 50Hz (single-phase)
characteristic: 1. Suitable for researching and developing the resistivity of various materials and thin film materials 2. Advanced application temperature control technology, real-time temperature program synchronous scanning 3. Free temperature rise/fall, precise temperature control program, data measurement during heating, constant temperature and cooling processes 4. Automatic pressure safety protection design ensures that there will be no explosion during the testing process 5. The sample holder adopts a unique contact balancing mechanism to ensure high reproducibility of measurement 6. Optional original sheet sample measurement system 7. Optional advanced data acquisition technology to avoid interference errors caused by circuit board data acquisition technology
