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XD-4 X- ray diffractometer for Substance identification

Product ID:FXys005

Price: Please inquire PDF Format
Supply Ability:20SETS/MON
Port:SHENZHEN
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  • Product Introduction
  • Consulting
  • Model NumberXD-4
    Brand NameYIMA
    Payment TermsT/T, paypal
    Brief introduction
    X -ray diffraction is the most widespread application of X -ray diffraction analysis instruments. X -ray diffraction is mainly used in the sample
    Product phase qualitative or quantitative analysis , the crystal structure analysis , the determination of macroscopic stress structural material , large grains
    Small measured crystallinity determination , etc., can be installed in accordance with the actual needs of a variety of special features and accessories appropriate control and
    Computer software , consisting diffractometer with special functions .
    Main features:
    Crystal orientation can be determined accurately measured lattice constants , the determination of grain size , performed substances phase qualitative and quantitative analysis , but also on the surface of a thin film of metal and other materials were tested.
    Technical parameters:
    Maximum power : 3 kW
    Angle measurement repeatability : ≤0.0016 °
    Scan range : -30 ° ~ 160 °
    Resolution : ≤0.09 °
    Angle measurement accuracy : ≤ 0.0052 ° (2θ)
     

  • Brief introduction
    X -ray diffraction is the most widespread application of X -ray diffraction analysis instruments. X -ray diffraction is mainly used in the sample
    Product phase qualitative or quantitative analysis , the crystal structure analysis , the determination of macroscopic stress structural material , large grains
    Small measured crystallinity determination , etc., can be installed in accordance with the actual needs of a variety of special features and accessories appropriate control and
    Computer software , consisting diffractometer with special functions .
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