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SE-Glass Spectral Ellipsometer

Product ID:GGCtpy008

Price: Please inquire PDF Format
Supply Ability:20SETS/MON
Port:SHENZHEN
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  • Product Introduction
  • Consulting
  • Model NumberSE-Glass
    Brand NameWUHANYIGUANG
    Payment TermsT/T, paypal
    SE-Glass Spectral Ellipsometer 
    Introduction:
    Spectral ellipsometer SE-Glass is a special-purpose spectroscopic ellipsometer customized for the glass cover industry. It is designed for the glass cover optical coating industry to eliminate the transparent base back measurement by the integrated micro-spot + visual leveling system. Characterization analysis of the physical properties of the multilayer film on the glass cover plate. Spectral ellipsometer SE-Glass is widely used in the film thickness of glass substrate mountain anti-reflection film, dimming film, conductive film, etc., optical constant measurement, perfect for glass coating, optical film and other coating detection applications.
    Features:
     1. Customized development of special spectral ellipsometer for mobile glass cover optical coating process
    2. Rotary compensator measurement technology and optical modeling technology
    3, micro-spot integrated design to eliminate the impact of glass / diaphragm base back
    4, visual sample stage leveling module to solve 3D glass measurement positioning problem
    5, the industry's original diaphragm coating processing algorithm directly measuring PET film coating
    Technical Parameters:
    Automation level: support automation program customization
    Application positioning: glass-specific
    Basic functions: Psi/Delta, N/C/S, etc.
    Analytical spectrum: 380-1000nm, support on-demand customization
    Single measurement time: 0.5-5s
    Repeatability measurement accuracy: 0.01nm
  • Introduction:
    Spectral ellipsometer SE-Glass is a special-purpose spectroscopic ellipsometer customized for the glass cover industry. It is designed for the glass cover optical coating industry to eliminate the transparent base back measurement by the integrated micro-spot + visual leveling system. Characterization analysis of the physical properties of the multilayer film on the glass cover plate. Spectral ellipsometer SE-Glass is widely used in the film thickness of glass substrate mountain anti-reflection film, dimming film, conductive film, etc., optical constant measurement, perfect for glass coating, optical film and other coating detection applications.
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